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1

Assessment of IS-innovation strategic alignment factors among universal banks in Ghana

Yaw Obeng, Asare, Mkhize, Peter L.

Journal:

The Electronic Journal of Information Systems in Developing Countries

Year:

2019

Language:

english

File:

PDF, 316 KB

english, 2019

2

A case study on the impact of local material chemistry on the mechanical reliability of packaged integrated circuits: Correlation of the packaging fallout to the chemistry of passivation dielectrics

Chukwudi A. Okoro, Yaw S. Obeng

Journal:

Thin Solid Films

Year:

2012

Language:

english

File:

PDF, 424 KB

english, 2012

3

The influence of pulse plating frequency and duty cycle on the microstructure and stress state of electroplated copper films

Marro, James B., Darroudi, Taghi, Okoro, Chukwudi A., Obeng, Yaw S., Richardson, Kathleen C.

Journal:

Thin Solid Films

Year:

2017

Language:

english

File:

PDF, 1.70 MB

english, 2017

4

Toward Clean and Crackless Transfer of Graphene

Liang, Xuelei, Sperling, Brent A., Calizo, Irene, Cheng, Guangjun, Hacker, Christina Ann, Zhang, Qin, Obeng, Yaw, Yan, Kai, Peng, Hailin, Li, Qiliang, Zhu, Xiaoxiao, Yuan, Hui, Hight Walker, Angela R.

Journal:

Year:

2011

Language:

english

File:

PDF, 4.70 MB

english, 2011

5

Defect and microstructural evolution in thermally cycled Cu through-silicon vias

Marro, James, Okoro, Chukwudi, Obeng, Yaw, Richardson, Kathleen

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.98 MB

english, 2014

6

The impact of IT-technological innovation on the productivity of a bank’s employee

Yaw Obeng, Asare, Boachie, Emmanuel, Liu, Shaofeng

Journal:

Cogent Business & Management

Year:

2018

Language:

english

File:

PDF, 952 KB

english, 2018

7

A review of trends, policies and plans for increasing energy access in Ghana

Francis Kemausuor, George Yaw Obeng, Abeeku Brew-Hammond, Alfred Duker

Journal:

Renewable and Sustainable Energy Reviews

Year:

2011

Language:

english

File:

PDF, 1.41 MB

english, 2011

8

Electrogenerated chemiluminescence. 53. Electrochemistry and emission from adsorbed monolayers of a tris(bipyridyl)ruthenium(II)-based surfactant on gold and tin oxide electrodes

Obeng, Yaw S., Bard, Allen J.

Journal:

Year:

1991

Language:

english

File:

PDF, 1.61 MB

english, 1991

9

Ionic strength dependence of intervalence transition bands in electron tunnelling processes

Lewis, Nita A., Obeng, Yaw S.

Journal:

Journal of the American Chemical Society

Year:

1988

Language:

english

File:

PDF, 295 KB

english, 1988

10

Oxidant-dependent nonadiabatic intervalence transitions

Lewis, Nita A., Obeng, Yaw S.

Journal:

Journal of the American Chemical Society

Year:

1989

Language:

english

File:

PDF, 281 KB

english, 1989

11

Electrochemistry and Langmuir trough studies of fullerene C60 and C70 films

Jehoulet, Christophe, Obeng, Yaw S., Kim, Yeon Taik, Zhou, Feimeng, Bard, Allen J.

Journal:

Journal of the American Chemical Society

Year:

1992

Language:

english

File:

PDF, 1.69 MB

english, 1992

12

Langmuir films of C60 at the air-water interface

Obeng, Yaw S., Bard, Allen J.

Journal:

Journal of the American Chemical Society

Year:

1991

Language:

english

File:

PDF, 256 KB

english, 1991

13

Accelerated Stress Test Assessment of Through-Silicon Via Using RF Signals

Okoro, Chukwudi, Kabos, Pavel, Obrzut, Jan, Hummler, Klaus, Obeng, Yaw S.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 984 KB

english, 2013

14

Langmuir-Blodgett and electrochemical studies of fullerene films

Bulhoes, Luis Otavio S., Obeng, Yaw S., Bard, Allen J.

Journal:

Chemistry of Materials

Year:

1993

Language:

english

File:

PDF, 930 KB

english, 1993

15

[IEEE 2012 IEEE 12th International Conference on Nanotechnology (IEEE-NANO) - Birmingham, United Kingdom (2012.08.20-2012.08.23)] 2012 12th IEEE International Conference on Nanotechnology (IEEE-NANO) - Metrology for nanosystems and nanoelectronics reliability assessments

Obeng, Yaw S., Okoro, Chukwudi A., Kopanski, Joseph J.

Year:

2012

Language:

english

File:

PDF, 732 KB

english, 2012

16

Medium effects in weakly coupled electron-transfer processes. Calculation of inner-sphere reorganizational energies at zero ionic strength

Lewis, Nita A., Obeng, Yaw S., Purcell, William L.

Journal:

Inorganic Chemistry

Year:

1989

Language:

english

File:

PDF, 543 KB

english, 1989

17

Nanoporous Ultralow Dielectric Constant Organosilicates Templated by Triblock Copolymers

Yang, Shu, Mirau, Peter A., Pai, Chien-Shing, Nalamasu, Omkaram, Reichmanis, Elsa, Pai, Janice C., Obeng, Yaw S., Seputro, Joko, Lin, Eric K., Lee, Hae-Jeong, Sun, Jianing, Gidley, David W.

Journal:

Chemistry of Materials

Year:

2002

Language:

english

File:

PDF, 67 KB

english, 2002

18

Pressure tuning spectroscopic study of electron-tunneling processes in solution

Lewis, Nita A., Obeng, Yaw S., Taveras, Daniel V., Van Eldik, Rudi

Journal:

Journal of the American Chemical Society

Year:

1989

Language:

english

File:

PDF, 499 KB

english, 1989

19

Self-assembled monolayers of parent and derivatized [n]staffane-3,3(n-1)-dithiols on polycrystalline gold electrodes

Obeng, Yaw S., Laing, Mark E., Friedli, Andrienne C., Yang, Huey C., Wang, Dongni, Thulstrup, Erik W., Bard, Allen J., Michl, Josef

Journal:

Journal of the American Chemical Society

Year:

1992

Language:

english

File:

PDF, 1.71 MB

english, 1992

20

Dielectric Materials for Advanced VLSI and ULSI Technologies

Obeng, Yaw S., Steiner, Kurt G., Velaga, Ankineedu N., Pal, Chien-Shing

Journal:

AT&T Technical Journal

Year:

1994

Language:

english

File:

PDF, 4.42 MB

english, 1994

21

[IEEE 2011 International Semiconductor Device Research Symposium (ISDRS) - College Park, MD, USA (2011.12.7-2011.12.9)] 2011 International Semiconductor Device Research Symposium (ISDRS) - Modified RCA clean transfer of graphene and all-carbon electronic devices fabrication

Liang, Xuelei, Sperling, Brent A., Calizo, Irene, Cheng, Guangjun, Hacker, Christina A., Zhang, Qin, Obeng, Yaw S., Yan, Kai, Peng, Hailin, Walker, Angela R. Hight, Richter, Curt A.

Year:

2011

Language:

english

File:

PDF, 455 KB

english, 2011

22

[IEEE 2012 IEEE International Interconnect Technology Conference - IITC - San Jose, CA, USA (2012.06.4-2012.06.6)] 2012 IEEE International Interconnect Technology Conference - Effect of thermal cycling on the signal integrity and morphology of TSV isolation liner- SiO2

Okoro, Chukwudi, Obeng, Yaw S.

Year:

2012

Language:

english

File:

PDF, 601 KB

english, 2012

23

A Detailed Failure Analysis Examination of the Effect of Thermal Cycling on Cu TSV Reliability

Okoro, Chukwudi, Lau, June W., Golshany, Fardad, Hummler, Klaus, Obeng, Yaw S.

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.26 MB

english, 2014

24

[IEEE 2013 IEEE 63rd Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2013.05.28-2013.05.31)] 2013 IEEE 63rd Electronic Components and Technology Conference - Use of RF-based technique as a metrology tool for TSV reliability analysis

Okoro, Chukwudi, Kabos, Pavel, Obrzut, Jan, Hummler, Klaus, Obeng, Yaw S.

Year:

2013

Language:

english

File:

PDF, 3.04 MB

english, 2013

25

[IEEE 2008 8th IEEE Conference on Nanotechnology (NANO) - Arlington, Texas, USA (2008.08.18-2008.08.21)] 2008 8th IEEE Conference on Nanotechnology - Strategies for Closing the ITRS Funding Gap

Obeng, Yaw S., Knight, Stephen, Martinez de Pinillos, Joaquin V.

Year:

2008

Language:

english

File:

PDF, 144 KB

english, 2008

26

Metrology and characterization of application specific chemical mechanical polishing pads

Zantye, Parshuram B., Mudhivarthi, S., Kumar, Ashok, Obeng, Yaw

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2005

Language:

english

File:

PDF, 750 KB

english, 2005

27

Influence of Metal–MoS 2 Interface on MoS 2 Transistor Performance: Comparison of Ag and Ti Contacts

Yuan, Hui, Cheng, Guangjun, You, Lin, Li, Haitao, Zhu, Hao, Li, Wei, Kopanski, Joseph J., Obeng, Yaw S., Hight Walker, Angela R., Gundlach, David J., Richter, Curt A., Ioannou, Dimitris E., Li, Qilian

Journal:

ACS Applied Materials & Interfaces

Year:

2015

Language:

english

File:

PDF, 3.71 MB

english, 2015

28

Synchrotron-based measurement of the impact of thermal cycling on the evolution of stresses in Cu through-silicon vias

Okoro, Chukwudi, Levine, Lyle E., Xu, Ruqing, Hummler, Klaus, Obeng, Yaw

Journal:

Journal of Applied Physics

Year:

2014

Language:

english

File:

PDF, 1.44 MB

english, 2014

29

[IEEE 2013 IEEE 63rd Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2013.05.28-2013.05.31)] 2013 IEEE 63rd Electronic Components and Technology Conference - X-ray micro-beam diffraction determination of full stress tensors in Cu TSVs

Okoro, Chukwudi, Levine, Lyle E., Xu, Ruqing, Tischler, Jonathan Z., Liu, Wenjun, Kirillov, Oleg, Hummler, Klaus, Obeng, Yaw S.

Year:

2013

Language:

english

File:

PDF, 851 KB

english, 2013

30

Nuclear-magnetic-resonance characterization of doped SiO2 films used in integrated circuits

Schilling, Frederic C., Steiner, Kurt G., Obeng, Yaw S.

Journal:

Journal of Applied Physics

Year:

1995

Language:

english

File:

PDF, 1.24 MB

english, 1995

31

[IEEE 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) - Orlando, FL, USA (2014.5.27-2014.5.30)] 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) - X-ray micro-beam diffraction measurement of the effect of thermal cycling on stress in Cu TSV: A comparative study

Okoro, Chukwudi, Levine, Lyle E., Xu, Ruqing, Hummler, Klaus, Obeng, Yaw

Year:

2014

Language:

english

File:

PDF, 659 KB

english, 2014

32

[IEEE 2015 International Conference on Microelectronic Test Structures (ICMTS) - Tempe, AZ (2015.3.23-2015.3.26)] Proceedings of the 2015 International Conference on Microelectronic Test Structures - Electromagnetic field test structure chip for back end of the line metrology

Lin You,, Jung-Joon Ahn,, Hitz, Emily, Michelson, Jonathon, Yaw Obeng,, Kopanski, Joseph

Year:

2015

Language:

english

File:

PDF, 1.02 MB

english, 2015

33

Metrology of Psiloquest's Application Specific Pads (ASP) for CMP Applications

Zantye, Parshuram B., Mudhivarthi, S., Sikder, Arun K., Kumar, Ashok, Obeng, Yaw

Journal:

MRS Proceedings

Year:

2004

Language:

english

File:

PDF, 431 KB

english, 2004

34

[ECS ISTC/CSTIC 2009 (CISTC) - Shanghai, China (March 19 - March 20, 2009)] ECS Transactions - Advanced Metrology for Nanoelectronics at the National Institute of Standards and Technology

Martinez de Pinillos, Joaquin V., Obeng, Yaw, Knight, Stephen

Year:

2009

Language:

english

File:

PDF, 551 KB

english, 2009

35

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Metrology and Characterization Challenges for Emerging Research Materials and Devices

Garner, C. Michael, Herr, Dan, Obeng, Yaw, Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 118 KB

english, 2011

36

[IEEE 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) - San Diego, CA, USA (2015.5.26-2015.5.29)] 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) - Experimentally, how does Cu TSV diameter influence its stress state?

Okoro, Chukwudi, Levine, Lyle E., Xu, Ruqing, Obeng, Yaw S.

Year:

2015

Language:

english

File:

PDF, 1.06 MB

english, 2015

37

Subsurface imaging of metal lines embedded in a dielectric with a scanning microwave microscope

You, Lin, Ahn, Jung-Joon, Obeng, Yaw S, Kopanski, Joseph J

Journal:

Journal of Physics D Applied Physics

Year:

2016

Language:

english

File:

PDF, 2.82 MB

english, 2016

38

[IEEE 2015 16th International Conference on Electronic Packaging Technology (ICEPT) - Changsha, China (2015.8.11-2015.8.14)] 2015 16th International Conference on Electronic Packaging Technology (ICEPT) - iNEMI project on automotive electronic material challenges

Schaffer, Mark, Sandy-Smith, Brook, Obeng, Yaw, Lee, Jeffrey, Chen, WangChu, Lee, Dem, Liou, Peggy

Year:

2015

Language:

english

File:

PDF, 818 KB

english, 2015

39

‘Back end’ Chemical Cleaning in integrated Circuit Fabrication: a Tutorial

Obeng, Yaw S., Raghavan, R. S.

Journal:

MRS Proceedings

Year:

1997

Language:

english

File:

PDF, 1.88 MB

english, 1997

40

Dynamic Mechanical Analysis (DMA) of CMP pad materials

Li, Irene, Forsthoefel, Kersten M., Richardson, Kathleen A., Obeng, Yaw S., Easter, William G., Maury, Alvaro

Journal:

MRS Proceedings

Year:

2000

Language:

english

File:

PDF, 3.34 MB

english, 2000

41

Experimental measurement of the effect of copper through-silicon via diameter on stress buildup using synchrotron-based X-ray source

Okoro, Chukwudi, Levine, Lyle E., Xu, Ruqing, Obeng, Yaw

Journal:

Journal of Materials Science

Year:

2015

Language:

english

File:

PDF, 1.73 MB

english, 2015

42

Low Frequency Radio Wave Detection of Electrically Active Defects in Dielectrics

Obeng, Yaw S., Okoro, Chukwudi A., Amoah, Papa K., Franklin, Rhonda R., Kabos, Pavel

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 752 KB

english, 2016

43

Towards Understanding Early Failures Behavior during Device Burn-In: Broadband RF Monitoring of Atomistic Changes in Materials

Obeng, Yaw S., Okoro, Chukwudi A., Amoah, Papa K., Dai, Johnny, Vartanian, Victor H.

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 601 KB

english, 2016

44

The Impact of Organic Additives on Copper Trench Microstructure

Marro, James B., Okoro, Chukwudi A., Obeng, Yaw S., Richardson, Kathleen C.

Journal:

Journal of The Electrochemical Society

Year:

2017

Language:

english

File:

PDF, 1.27 MB

english, 2017

45

Microwave evaluation of electromigration susceptibility in advanced interconnects

Sunday, Christopher E., Veksler, Dmitry, Cheung, Kin C., Obeng, Yaw S.

Journal:

Journal of Applied Physics

Year:

2017

Language:

english

File:

PDF, 1.45 MB

english, 2017

46

Broadband Dielectric Spectroscopic Characterization of Thermal Stability of Low-k Dielectric Thin Films for Micro- and Nanoelectronic Applications

Sunday, Christopher E, Montgomery, Karl R., Amoah, Papa K., Iwuoha, Emmanuel I, Obeng, Yaw S.

Journal:

ECS Transactions

Year:

2017

Language:

english

File:

PDF, 1.63 MB

english, 2017

47

Broadband Dielectric Spectroscopic Characterization of Thermal Stability of Low-k Dielectric Thin Films for Micro- and Nanoelectronic Applications

Sunday, Christopher E., Montgomery, Karl R., Amoah, Papa K., Obeng, Yaw S.

Journal:

ECS Journal of Solid State Science and Technology

Year:

2017

Language:

english

File:

PDF, 1022 KB

english, 2017

48

(Invited) Understanding the Pre-Failure Thermo-Mechanical Issues in Electromigration of TSV Enabled 3D ICs

Sunday, Christopher E, Veksler, Dmitry, Cheung, K. P., Obeng, Yaw S.

Journal:

ECS Transactions

Year:

2017

Language:

english

File:

PDF, 1024 KB

english, 2017

49

Physicians’ knowledge, attitudes, and perceptions concerning antibiotic resistance: a survey in a Ghanaian tertiary care hospital

Labi, Appiah-Korang, Obeng-Nkrumah, Noah, Bjerrum, Stephanie, Aryee, Nii Armah Adu, Ofori-Adjei, Yaw Adjei, Yawson, Alfred E., Newman, Mercy J.

Journal:

BMC Health Services Research

Year:

2018

Language:

english

File:

PDF, 937 KB

english, 2018

50

Antibiotic use in a tertiary healthcare facility in Ghana: a point prevalence survey

Labi, Appiah-Korang, Obeng-Nkrumah, Noah, Nartey, Edmund Tetteh, Bjerrum, Stephanie, Adu-Aryee, Nii Armah, Ofori-Adjei, Yaw Adjei, Yawson, Alfred E., Newman, Mercy J.

Journal:

Antimicrobial Resistance and Infection Control

Year:

2018

Language:

english

File:

PDF, 755 KB

english, 2018

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